LA3220-E中文资料

Monolithic Linear IC

Ordering number:ENN912D

SANYO Electric Co.,Ltd. Semiconductor Company

TOKYO OFFICE T okyo Bldg., 1-10, 1 Chome, Ueno, T aito-ku, TOKYO, 110-8534 JAPAN

Package Dimensions

unit:mm

Features

? Dual pre-amp with built-in ALC (pre-amp × 2 + ALC ×2).

? Due to high gain, recording amp can be formed sepa-rately (variable monitor possible).

? ALC and direct motor drive obtained through SEPP out-put stage.

? Good ALC response balance between channels. ? Good reduced voltage characteristic. ? Excellent channel separation.

? Quick stabilization during power supply input.

?C ?C

Operating Conditions at Ta = 25?C

Specifications

Absolute Maximum Ratings at Ta = 25?C

r

e t e m a r a P l o b m y S s n o i t i d n o C s

g n i t a R t i n U e g a t l o v y l p p u s r e w o p m u m i x a M V C C x a m 41V n o i t a p i s s i d r e w o p e l b a w o l l A x a m d P 0

06W m e r u t a r e p m e t g n i t a r e p O r p o T 57+o t 02–e r u t a r e p m e t e g a r o t S g

t s T 5

21+o t 04–t

n e r r u c e l b a w o l l a .r T C L A 5

.3A

m Ta ≤40?C

r

e t e m a r a P l o b m y S s

n o i t i d n o C s

g n i t a R t i n U e g a t l o v y l p p u s r e w o p d e d n e m m o c e R V C C 3

1o t 5V e

c n a t s i s e r

d a o L R L

86n a h t s s e l t o n ?

Operating Characteristics at Ta = 25?C, V CC =5V, f=1kHz, R L =10k ? (PB), Rg=680? (REC),

See specified Test Circuit.

r

e t e m a r a P l o b m y S s

n o i t i d n o C s

g n i t a R t i n U n

i m p y t x a m t n e r r u c t n e c s e i u Q I O C C 5.40

1A m n i a g e g a t l o v n e p O G V O 58B d n

i a g e g a t l o V G V B P 04B d C E R 85B d e

g a t l o v t u p t u o m u m i x a M V O x

a m B

P ,%1=D H T 9

.02

.1V

Continued on next page.

Test Circuit

Example of Print Pattern (copper foil side)

1. Circuit Construction

This is a dual pre-amp composed of AMP × 2, ACL × 2. Input is obtained from NPN differntial TR1, TR2 ; and differntial load uses active element TR3 to obtain high voltage gain. The output stage is push-pull system with drive for low load impedance, and can be directly connected to ALC circuit and meter circuit. Also, because the amp open loop gain is sufficiently high, it can be used for recording amp and variable monitor is possible. Input impedance is determined by built-in resistor R1, and is 30k?.

ALC Circuit

The ALC circuit is composed of TR1, TR2, and due to DC voltage applied to the 7 control terminals, allows variable impedance between TR1 collector and emitter and controls pre-amp input level.

Attack Time and Recovery Time

Attack time is between when input signal is applied until ALC begins to operate. Rcover time is between justed by R2, C3 time constant. Recovery time is between when input signal disappears to when amp level returns to the original level. Attack time can be adjusted by C4, R3 time constant.

continued on next page.

oop gain VG (f=1kHz)

loop voltage gain is gotten at (f=1kHz) VG ≈ 20log Z1/Z3 1=7.2k?

3=56?

VG=20log 7.2 × 103 /56 becomes=42dB.

re, equalizer response is determined by these constants. yback amp gain is :

log R1/R3 in low frequency regions

log Z2/Z3 in high frequency regions

ng amp gain is

20log R1/R3

constants

l constants are related to the operation starting time

mp.

eration starting time is designed to be within 0.2s,

his case it is necessary that the differential TR1

2 is the same in time constant. The condition is :

R1//R2)=R5 · C3

mple :If C1=220μ, R1//R2=5k?, R5=51k?

Specifications of any and all SANYO products described or contained herein stipulate the performance, characteristics, and functions of the described products in the independent state, and are not guarantees

of the performance, characteristics, and functions of the described products as mounted in the customer's products or equipment. To verify symptoms and states that cannot be evaluated in an independent device, the customer should always evaluate and test devices mounted in the customer's products or equipment. SANYO Electric Co., Ltd. strives to supply high-quality high-reliability products. However, any and all semiconductor products fail with some probability. It is possible that these probabilistic failures could give rise to accidents or events that could endanger human lives, that could give rise to smoke or fire,