SIGC81T120R2CS
IGBT Chip in NPT-technology
This chip is used for: ? IGBT Modules
FEATURES:
? 1200V NPT technology 175μm chip ? low turn-off losses ? short tail current
? positive temperature coefficient ? easy paralleling
? integrated gate resistor
Applications:
? drives, SMPS, resonant
applications
Chip Type
V CE I Cn Die Size
Package Ordering Code SIGC81T120R2CS 1200V 50A 9.08 X 8.98 mm 2
sawn on foil
Q67050-A4050-A001
MECHANICAL PARAMETER: Raster size 9.08 X 8.98 Emitter pad size 8 x (2.6 x 1.78) Gate pad size 1.46 x 0.8 Area total / active 81.5 / 63.5
mm 2
Thickness 180 μm Wafer size 150 mm Flat position
90 grd
Max.possible chips per wafer
167 pcs Passivation frontside Photoimide Emitter metallization 3200 nm Al Si 1%
Collector metallization 1400 nm Ni Ag –system
suitable for epoxy and soft solder die bonding
Die bond electrically conductive glue or solder
Wire bond
Al, <500μm Reject Ink Dot Size
? 0.65mm ; max 1.2mm
Recommended Storage Environment
store in original container, in dry nitrogen, < 6 month at an ambient temperature of 23°C
SIGC81T120R2CS
MAXIMUM RATINGS : Parameter
Symbol Value Unit Collector-emitter voltage, T j =25 °C V CE 1200
V DC collector current, limited by T jmax I C 1 )
A Pulsed collector current, t p limited by T jmax I c p u l s 150 A Gate emitter voltage
V GE ±20 V Operating junction and storage temperature
T j , T s t g
-55 ... +150
°C
1 )
depending on thermal properties of assembly STATIC CHARACTERISTICS (tested on chip), T j =25 °C, unless otherwise specified: Value
Parameter
Symbol Conditions min. typ. max. Unit
Collector-emitter breakdown voltage V (BR)CES V GE =0V , I C =3mA 1200 Collector-emitter saturation voltage V CE(sat) V GE =15V, I C =50A 2.7 3.2 3.7 Gate-emitter threshold voltage V GE(th) I C =2mA , V GE =V CE 4.5 5.5 6.5 V Zero gate voltage collector current I CES V CE =1200V , V GE =0V 6 μA Gate-emitter leakage current I GES V CE =0V , V GE =20V
300 nA Integrated gate resistor
R Gint
5
7
? ELECTRICAL CHARACTERISTICS (tested at component): Value
Parameter Symbol Conditions min. typ. max. Unit Input capacitance C i s s - 3.3 Output capacitance
C o s s - 0.5 Reverse transfer capacitance
C r s s
V C E =25V, V GE =0V, f =1MHz
-
0.22
nF
SWITCHING CHARACTERISTICS (tested at component), Inductive Load Value
Parameter Symbol Conditions 1) min. typ. max. Unit Turn-on delay time t d(on) - 60 Rise time
t r - 50 Turn-off delay time t d (o f f ) - 400 Fall time
t f
T j =125°C V C C =600V, I C =50A, V GE =-15/15V, R G = 15?
-
60
ns
1)
values also influenced by parasitic L- and C- in measurement and package.
SIGC81T120R2CS CHIP DRAWING:
SIGC81T120R2CS
FURTHER ELECTRICAL CHARACTERISTICS:
This chip data sheet refers to the
device data sheet Eupec FP50R12KS4C DESCRIPTION:
AQL 0,65 for visual inspection according to failure catalog
Electrostatic Discharge Sensitive Device according to MIL-STD 883
Test-Normen Villach/Prüffeld
Published by
Infineon Technologies AG,
Bereich Kommunikation
St.-Martin-Strasse 53,
D-81541 München
? Infineon Technologies AG 2002
All Rights Reserved.
Attention please!
The information herein is given to describe certain components and shall not be considered as warranted characteristics.
Terms of delivery and rights to technical change reserved.
We hereby disclaim any and all warranties, including but not limited to warranties of non-infringement, regarding circuits, descriptions and charts stated herein.
Infineon Technologies is an approved CECC manufacturer.
Information
For further information on technology, delivery terms and conditions and prices please contact your nearest Infineon Technologies Office in Germany or our Infineon Technologies Representatives world-wide (see address list).
Warnings
Due to technical requirements components may contain dangerous substances. For information on the types in question please contact your nearest Infineon Technologies Office.
Infineon Technologies components may only be used in life-support devices or systems with the express written approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure of that life-support device or system, or to affect the safety or effectiveness of that device or system. Life support devices or systems are intended to be implanted in the human body, or to support and / or maintain and sustain and / or protect human life. If they fail, it is reasonable to assume that the
health of the user or other persons may be endangered.